Measure today to guarantee tomorrow
AI-powered OEE analytics, waste tracking, and defect detection. Built for manufacturers who want visibility without the enterprise price tag.
The Quality Data Gap
PLCs track production volume, cycle times, and downtime — but NOT quality. Without integrated quality data, you cannot compute true OEE, first-pass yield, or run AI that predicts defects.
Paper & Excel Quality Records
Inspection results, defect counts, and scrap data live on clipboards and spreadsheets — disconnected from production systems.
No Real-Time Quality Visibility
Shift supervisors discover quality issues hours or days after they happen. By then, the waste has already occurred.
AI Missing Half the Picture
Machine data tells you how fast you ran - not how much was good quality. Without quality data, AI predictions are incomplete.
Production Intelligence That Sees Everything
Pantheon AI bridges the quality data gap — ingesting your Excel records or connecting directly to an SQL Server, and joining them with PLC machine data.
OEE Analytics
12-week trends, Availability × Performance × Quality breakdown with real targets.
Waste & Scrap Tracking
Track waste by job, shift, and machine. AI reveals patterns invisible to the naked eye.
Defect Detection
Pareto analysis of defect types, SPC control limits, and recurring defect identification.
Anomaly Alerts
Rolling z-score detection flags unusual patterns before they become costly problems.
Batch Prediction
Blend live + historical rates to predict batch completion and quality outcomes.
Machine Health
Speed decline detection, downtime analysis and maintenance indicators.